Compatibility
8 beta/preview
Package applicability is under review; follow the stated version and platform limits.
8 beta/preview
Package applicability is under review; follow the stated version and platform limits.
Inspect the whole stack
- Compare the layer order, mask type and physical function before and after the change.
- Inspect the generated geometry at vias and terminal contacts, including the layers immediately above and below the new layer.
- Check whether the new layer blocks a via etch, adds a conductive path or changes the intended resistor contact.
- Apply ViaBypass or other connectivity controls only when they represent the actual process. Verify the affected and previously working connections in a small model.
Know what ViaBypass does
For the documented conductive mask types, ViaBypass allows a via etch through the isolation above to continue into the isolation below when no conductive object blocks it. It is a process-modelling rule, not a general switch for fixing all open circuits.
Support may supply a process-specific model. Do not transfer another fabrication process's layer parameters into your own stack.
Sources and verification details
Recorded inputs/builds only. Complete walkthrough and final-package acceptance remain separate.
- support:SUP-010 · Generalised editorial finding; outcome qualification retained
- inductex:docs/manual/ix_ldf.tex · Layer definitions; ViaBypass; mask and connectivity parameters
- Support history informed this draft. Current-source guidance has been checked; a fresh walkthrough on the intended distributed release and product-owner review remain pending.
